陈恒生(Hansen Chen's Resume)
(1) 学历 (Education Background) :
国立台湾大学 材料科学与工程学系暨研究所 硕士 (1986~1988)
Master, Institute of Materials Science and Engineering, National Taiwan University (1986-1988)
国立清华大学 材料科学工程学系 学士 (1982~1986)
Bachelor, Department of Materials Science and Engineering, National Tsing Hua University (1982-1986)
(2) 经历 (Experience) :
科诚(科技)有限公司 业务副总 (From 2005)
Technology Bridge Co.,LTD. VP of sales.
科荣股份有限公司 协理 (From 1997 till 2005)
Scientek Corporation, Sales (From1990)
Scientek Corporation, Director (From 1997)
Director of Agent Business Division and Department leader of Group 4.
Director of Market Development Division
Director of Agent Business Division and Division Sales leader.
国立台湾大学 材料科学与工程学系暨研究所 系友会理事 (2002~Now)
Councilor of Alumnus association of Institute of Materials Science and Engineering, National Taiwan University (2002~Now)
非游离辐射操作人员执照
Operation license for non-ionization radiation equipment, Atomic Energy Commission (AEC), ROC.
(3) 经验 (Experience) :
从事分析仪器及设备之销售及技术服务超过15年.客户遍及研究单位,各大学院校,半导体业,平面显示器业,精密粉末工业,化工业等.领导之技术团体,提供奈米,薄膜,表面科学分析与技术之服务.并已扩展业务至大陆地区.相关经验如下:
Dedicated for Instrument & Equipments technical market over 15 years from 1990. Major field cover R&D unit, University, Semiconductor-Metrology/Failure Analysis, Flat panel display, fine powder, chemistry engineering industries…. Provide analysis and technical supporting for Nano technology, thin film and surface science field by a technical team including Taiwan and China territory.
Relative experience as follow
3.1 扫描式探针显微镜(Scanning Probe Microscope) From 1993.
已销售超过200台各式扫描式探针显微镜. Sell over 200 SPMs.
代理过相关扫描式探针显微镜产品如下(SPM product experience) :
Veeco : DI, Topometrixs, PSI...SPM family.
Unisoku : Ultra low temperature, ultra high vacuum, variable magnetic SPM.
RHK : UHV SPM/STM/AFM.
Hysitron : Nanomechanical behavior measurement.
Nano Instrument (MTS) : Nano mechanical test.
3rdTech : Nanomapulation interface.
nPoint : Capacitance close loop stage/system, Nano Carbon Tube SPM tip.
Multiprobe : multi probe scanning force probing for electrical application. Can add up to 5 probes.
Sutter : Optical fiber puller for NSOM tip application.
Silicon-MDT (Mikromasch) : SPM tips and grating.
Others : Nanotechnology SPM related platform.
3.2 X-ray绕射仪(XRD) X-ray萤光分析仪(XRF), 全反射萤光分析仪(TXRF),绕射仪(XRD), From 1992
代理过相关X-ray产品如下 (X-ray product experience) :
Rigaku : XRF for film thickness and composition measurement
TXRF for surface contamination measurement
XRR for ultra thin film thickness, density, interface roughness and pore size measurement
SAXS for pore size distribution.
GXR for XRF/XRR/XRD/SAXS combination system
Scientag (Thermal group) : powder and thin film XRD.
Spectrace (Thermal Group) : EDXRF.
AXIC : Bench top EDXRF\WDXRF.
3.3椭圆仪(Ellipsometer), From 1998.
代理过相关产品如下 (Optical and Ellipsometer product experience) :
Jobin Yvon : Multi wavelength Spectroscopic Ellipsometer
Jobin Yvon : Single wavelength laser Spectroscopic Ellipsometer (Philips before)
Horiba : On line TFT and 300mm full automatic Spectroscopic Ellipsometer
Horiba : On line 300mm Auto Raman spectrometer for Epi wafer SiGe film stress measurement.
3.4表面分析仪 (Surface analysis instrument) : 代理过相关产品如下 (Surface analysis product experience) :
VG-S : AES/ESCA/Angle resolution AES. UHV Chamber, source, detector..
CAMECA : Dynamic SIMS, NanoSIMS, LEXES for low implanting measurement
3.5材料粉末分析仪 ( Powder and Particle size analyzer) : 代理过相关产品如下 (product experience) :
Micrometricits : Surface area, Particle size, Pore size and Density analyzer,
PSS : Dynamic Laser Scattering Nano Particle size analyzer.
MSP : Nano particle deposition and sizing system
3.6设备 (Equipments) : 目前过相关产品如下 (product experience) :
VG-Semicon : MBE, SiGe HVCVD.
OIPT : RIE, PECVD, IBD equipment.
Cenntor/VI : Ultra high temperature and vacuum furnace.
Astro/Brew : Ultra high temperature and vacuum furnace.
Harper : Precious gas control high temperature furnace for Powder application.
IDE : Active and Passive vibration-proof system and EMI (EM isolation system)
Vibration/Acoustic/EM noise site survey.
3.7 其它相关技术产品 (Other Technical product experience)
Semitest : Surface charge analyzer.
Metryx Mentor : On Line Low K density and film deposition/etching thickness monitor for Semiconductor.
PVA-Tepla : TWIN for wide range 10e12~10e16 dose monitor. SIRD for wafer bulk stress measurement.
LA-Wave : Film surface mechanical behavior measurement.
Control semiconductor : FATCAT-Laser layer by layer dry IC decap system with LIBS
(Laser Induced Breakdown Spectrometer).
Hypervision : Emission Microscope for Semiconductor FA application.
Oxford Instrument : Superconductor magnetic and ultra low temperature sample holder.
Process tube : Integrated O2, Moisture, and particle size measurement system.
Quantomix : Wet SEM sample capsule to see alive sample under SEM.
Nano System : Optical profiler.
(4) 发表及演讲 (Publish and Speech) :
4.1金属粉末射出成型真空一次脱蜡烧结法,粉末冶金月刊.
Metal Injection Molding, One step Vacuum de-wax sintering process, Powder metallurgy monthly.
4.2 AFM(SPM)在半导体工业之应用,第三届毫微米元件技术研讨会演讲,1996年5月.国科会国家毫微米元件实验室.
AFM(SPM) application on Semiconductor industry, The third symposium on Nano device technology. National Nano Device Laboratory (NDL), Semiconductor center of NCTU, The Electronics Devices and Materials Association, Union Chemical Laboratories (UCL) of ITRI.
4.3原子力显微镜在生化科学之应用研讨会演讲,1997年6月.国科会精密仪器发展中心.
AFM on Bio-science application conference, 1997/6, Precision Instrument Development Center (PIDC).
4.4 SPM在半导体工业之运用与实例,量测资讯57期,1997年9月.与衣冠君博士(先前任职于茂德科技,现任职中芯半导体)合着.
SPM application example on Semiconductor industry, No.57 of Measurement information of Center for Measurement Standards (CMS) of ITRI.
4.5扫描式电容显微镜(Scanning Capacitance Microscope,SCM), 1998年9月.国科会精密仪器发展中心出版,仪器总览5材料分析仪器P.50~P.53.与许朝雄(先前任职于科荣股份有限公司,现任职FEI公司)合着.
Scanning Capacitance Microscope, SCM. 1998/9. Introduction to Instrumentation, Part 5, material analysis, Precision Instrument Development Center (PIDC).
4.6磁力显微镜(Magnetic Force Microscope, MFM), 1998年9月.国科会精密仪器发展中心出版,仪器总览5材料分析仪器P.54~P.55.与许朝雄(先前任职于科荣股份有限公司,现任职FEI公司)合着
Magnetic Force Microscope, MFM. 1998/9. Introduction to Instrumentation, Part 5, material analysis, Precision Instrument Development Center (PIDC).
4.7电力显微镜(Electric Force Microscope, EFM), 1998年9月.国科会精密仪器发展中心出版,仪器总览5材料分析仪器P.56~P.58.与许朝雄(先前任职于科荣股份有限公司,现任职FEI公司)合着.
Electric Force Microscope, EFM. Introduction to Instrumentation, Part 5, material analysis, Precision Instrument Development Center (PIDC).
4.8扫描式探针显微镜之发展及应用,1998年10月.中华民国电子显微镜学会,第19届学术研讨会演讲.
SPM development and it’s application, 1998/10,The 19th academic conference, The ROC electrical microscopy association.
4.9半导体仪器分析介绍,1999年,中山大学半导体推广课程演讲.
Semiconductor instrument analysis introduction, 1999. Semiconductor research center. National Sun Yat-Sen University.
4.10 X光萤光光谱仪之应用,量测资讯66期,1999年3月.与林勇志(先前任职科荣股份有限公司,现任职科诚有限公司,中国分公司)合着.
X-ray fluorescence spectrometer application. No.57 of Measurement information of Center for Measurement Standards (CMS) of ITRI. (Co-author, Lawrence Lin working as TBCL China area sales manager).
4.11 SPM Basic and it’s application on Biological,2002年FOM 2002 international conference. 中山大学演讲.
SPM Basic and it’s application on Biological, FOM2002 international conference, National Sun Yat-Sen University.
4.12 NanoTechnology Trend and Its Future,2002年11月.台湾大学 材料科学与工程学系暨研究所20周年庆演讲.
NanoTechnology Trend and Its Future-Speech,November,2002, The 20th annual celebration of Institute of Materials Science and Engineering, National Taiwan University
4.13多功能原子力显微镜-演讲, 2003/7/11,台湾联合大学系统(中央大学,交通大学,清华大学,阳明大学)-奈米科技研究中心.
The multi mode SPM introduction. 2003/7/11, Nanotechnology research center, University System of Taiwan. (National Central University, National Chiao Tung University, National Tsing Hua University, National Yang Ming University).
4.14 扫描式探针显微镜-讲师, 2003/8/26, 经济部工业局九十二年度化学工业科技人才培训计画-化学工业分析技术人才培训计画,奈米材料分析技术研习班.财团法人成大研究发展基金会.
SPM introduction, 2003/8/26, Industrial Development Bureau Ministry of Economic Affairs, 2003 Chemical industries engineer training program-Chemical industry analysis personal training project, Nano Material analysis technical class. NCKU (National Cheng Kuan University) Research and Development Foundation.
4.15 2003高解析多功能扫描式探针显微镜说明会, 2003/12/05,逢甲大学研发处－共同贵重仪器中心、奈米科技研发中心.科荣股份有限公司，逢甲大学研发处－创新育成中心、技术授权中心.
2003 high resolution multi mode SPM, 2003/12/5, Feng Chia University, Precision Instrument support Center, Nanotechnology research center, Office of Technology Licensing, Business Incubation Center. Scientek Corporation.
4.16 SPM原理操作与应用-演讲, 2003/12/20, 国立中正大学奈米科技学程中心,教育部中南区奈米人才培育联盟,中正大学光机电整合工程研究所,中正大学光机械学系.
SPM basic theory, operation and application, 2003/12/20,National Chung Cheng University, Center for the Nanotechnology Design & Prototyping, Graduate Institute of Opto-Mechatronics, Department of Mechanical Engineering. Nano-technology personal training for the center Taiwan region.
4.17 SPM家族介绍及其在奈米领域之应用,No.5. March 2004.经济部技术处,产业奈米技术应用促进会-产业奈米技术应用资讯园地-产业应用专刊.
SPM family introduction and their application on Nanotechnology. No.5. March,2004. Department of Industrial Technology, Ministry of Economic Affairs, R.O.C. Industries Nanotechnology application Promotion association.
Contact :
Hansenchen@tbcl.com.tw
Hansenchenkimo@yahoo.com.tw
http://nano-product.myweb.hinet.net/
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